High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry

Angerer TB, Blenkinsopp P, Fletcher JS

International Journal of Mass Spectrometry 377 (-) 591-598 [2015-02-00; online 2015-02-00]

Gothenburg Imaging Mass Spectrometry [Collaborative]

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DOI 10.1016/j.ijms.2014.05.015

Crossref 10.1016/j.ijms.2014.05.015