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Hinderling L, Heil HS, Rates A, Seidel P, Gunkel M, Diederich B, Guilbert T, Torro R, Bouchareb O, Demeautis C, Martin C, Brooks S, Sisamakis E, Grandgirard E, Mutterer J, Oatman H, Toettcher J, Rogov A, Antonovaite N, Johansson K, Ahnlinde JK, André O, Nordenfelt P, Nordenfelt P, Pfander C, Reymann J, Lambert T, Cosenza MR, Korbel JO, Pepperkok R, Kapitein LC, Pertz O, Norlin N, Halavatyi A, Camacho R
- - (-) - [2025-08-20; online 2025-08-20]
Integrated Microscopy Technologies Gothenburg [Technology development]
DOI 10.1101/2025.08.18.670881
Crossref 10.1101/2025.08.18.670881