Das L, Canto-Aguilar EJ, Tapani T, Lin H, Bhuvanendran H, Boulanger N, Salh R, Gracia-Espino E, Maccaferri N
J. Phys. D: Appl. Phys. 57 (38) 385303 [2024-09-27; online 2024-07-02]
Integrated Microscopy Technologies UmeƄ [Service]
DOI 10.1088/1361-6463/ad584a
Crossref 10.1088/1361-6463/ad584a