JSON
Damenti M, Coceano G, Mendes Silva M, Alvelid J, Sgattoni C, Rems L, Masullo LA, Unterauer EM, Kowalewski R, Volpato A, Delemotte L, Sezgin E, Jungmann R, Testa I
- - (-) - [2024-06-06; online 2024-06-06]
Integrated Microscopy Technologies Stockholm [Service]
DOI 10.1101/2024.06.05.597462
Crossref 10.1101/2024.06.05.597462