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Lammel T, Thit A, Mouneyrac C, Baun A, Sturve J, Selck H
Environ. Sci.: Nano 6 (4) 1140-1155 [2019-00-00; online 2019-00-00]
Integrated Microscopy Technologies Gothenburg [Service]
DOI 10.1039/c9en00093c
Crossref 10.1039/c9en00093c