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Doktorova M, Symons JL, Zhang X, Wang HY, Schlegel J, Lorent JH, Heberle FA, Sezgin E, Lyman E, Levental KR, Levental I
- - (-) - [2023-07-31; online 2023-07-31]
Integrated Microscopy Technologies Stockholm [Service]
DOI 10.1101/2023.07.30.551157
Crossref 10.1101/2023.07.30.551157