Correlative STED super-resolution light and electron microscopy on resin sections

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Wurm CA, Schwarz H, Jans DC, Riedel D, Humbel BM, Jakobs S

J. Phys. D: Appl. Phys. 52 (37) 374003 [2019-09-11; online 2019-07-16]

Integrated Microscopy Technologies Stockholm [Technology development]

DOI 10.1088/1361-6463/ab2b31

Crossref 10.1088/1361-6463/ab2b31