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Schlegel J, Porebski B, Andronico L, Hanke L, Edwards S, Brismar H, Murrell B, McInerney GM, Fernandez-Capetillo O, Sezgin E
Nano Lett. 23 (9) 3701-3707 [2023-05-10; online 2023-03-09]
Integrated Microscopy Technologies Stockholm [Service]
DOI 10.1021/acs.nanolett.2c04884
Crossref 10.1021/acs.nanolett.2c04884