Karras C, Smedh M, Förster R, Deschout H, Fernandez-Rodriguez J, Heintzmann R
Optics Communications 436 (-) 69-75 [2019-04-00; online 2019-04-00]
Integrated Microscopy Technologies Gothenburg [Service]
DOI 10.1016/j.optcom.2018.12.005
Crossref 10.1016/j.optcom.2018.12.005