Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Shard AG, Havelund R, Spencer SJ, Gilmore IS, Alexander MR, Angerer TB, Aoyagi S, Barnes JP, Benayad A, Bernasik A, Ceccone G, Counsell JDP, Deeks C, Fletcher JS, Graham DJ, Heuser C, Lee TG, Marie C, Marzec MM, Mishra G, Rading D, Renault O, Scurr DJ, Shon HK, Spampinato V, Tian H, Wang F, Winograd N, Wu K, Wucher A, Zhou Y, Zhu Z

J. Phys. Chem. B 119 (33) 10784-10797 [2015-08-20; online 2015-08-06]

Gothenburg Imaging Mass Spectrometry [Collaborative]

QC bibliography QC xrefs

DOI 10.1021/acs.jpcb.5b05625

Crossref 10.1021/acs.jpcb.5b05625