Significant Enhancement of Negative Secondary Ion Yields by Cluster Ion Bombardment Combined with Cesium Flooding

Philipp P, Angerer TB, Sämfors S, Blenkinsopp P, Fletcher JS, Wirtz T

Anal. Chem. 87 (19) 10025-10032 [2015-10-06; online 2015-09-25]

Gothenburg Imaging Mass Spectrometry [Collaborative]

QC bibliography QC xrefs

DOI 10.1021/acs.analchem.5b02635

Crossref 10.1021/acs.analchem.5b02635