{"entity": "publication", "iuid": "59dbc502a5354b9396c1d2f8cf1c7ace", "timestamp": "2026-06-16T12:10:41.795Z", "links": {"self": {"href": "https://publications.scilifelab.se/publication/59dbc502a5354b9396c1d2f8cf1c7ace.json"}, "display": {"href": "https://publications.scilifelab.se/publication/59dbc502a5354b9396c1d2f8cf1c7ace"}}, "title": "Polyoxoniobates as molecular building blocks in thin films.", "authors": [{"family": "Rambaran", "given": "Mark A", "initials": "MA", "orcid": "0000-0003-1054-221X", "researcher": {"href": "https://publications.scilifelab.se/researcher/cbfccbdb1f6b460cb2400194a4347ab4.json"}}, {"family": "Gorzs\u00e1s", "given": "Andr\u00e1s", "initials": "A", "orcid": "0000-0002-2298-8844", "researcher": {"href": "https://publications.scilifelab.se/researcher/8070792ccead4c809c89943d84cf0e03.json"}}, {"family": "Holmboe", "given": "Michael", "initials": "M", "orcid": "0000-0003-3927-6197", "researcher": {"href": "https://publications.scilifelab.se/researcher/2d069795b2434c7883f7017855bbb896.json"}}, {"family": "Ohlin", "given": "C Andr\u00e9", "initials": "CA", "orcid": "0000-0002-3804-6421", "researcher": {"href": "https://publications.scilifelab.se/researcher/cc8a24c050c04953abf72381de7e9885.json"}}], "type": "journal article", "published": "2021-11-16", "journal": {"title": "Dalton Trans", "issn": "1477-9234", "issn-l": null, "volume": "50", "issue": "44", "pages": "16030-16038"}, "abstract": "Niobium oxide thin films have been prepared by spin-coating aqueous solutions of tetramethylammonium salts of the isostructural polyoxometalate clusters [Nb10O28]6-, [TiNb9O28]7- and [Ti2Nb8O28]8- onto silicon wafers, and annealing them. The [Nb10O28]6- cluster yields films of Nb2O5 in the orthorhombic and monoclinic crystal phases when annealed at 800 \u00b0C and 1000 \u00b0C, respectively, whereas the [TiNb9O28]7- and [Ti2Nb8O28]8- clusters yield the monoclinic crystal phases of Ti2Nb12O29 and TiNb2O7 (titanium-niobium oxides) in different ratios. We also demonstrate a protocol for depositing successive layers of metal oxide films. Finally, we explore factors affecting the roughness of the films.", "doi": "10.1039/d1dt03116c", "pmid": "34613326", "labels": {"Integrated Microscopy Technologies Ume\u00e5": "Service"}, "xrefs": [], "notes": [], "created": "2022-04-01T07:19:23.793Z", "modified": "2022-04-01T07:19:38.908Z"}