XRMA and ToF-SIMS Analysis of Normal and Hypomineralized Enamel

Melin L, Lundgren J, Malmberg P, Norén JG, Taube F, Cornell DH

Microsc Microanal 21 (2) 407-421 [2015-04-00; online 2015-02-12]

Gothenburg Imaging Mass Spectrometry [Collaborative]

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DOI 10.1017/s1431927615000033

Crossref 10.1017/s1431927615000033